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An approach estimating the number of domain walls and eddy current losses in grain-oriented 3% Si-Fe tape wound cores

1980; IEEE Magnetics Society; Volume: 16; Issue: 4 Linguagem: Inglês

10.1109/tmag.1980.1060653

1941-0069

Yo Sakaki,

Magnetic properties of thin films

A method is presented for estimating the number of domain walls in grain-oriented 3% Si-Fe tape wound cores under sinusoidal flux conditions by extending the method developed in a study of the dynamic behavior of 50% Ni-Fe square-loop cores. The results show that the number of domain walls increases approximately with exciting frequency as f^{0.4 \sim 0.5} . The calculated eddy current loss based on the modified Pry and Bean equation and the obtained number of domain walls agree well with the measured loss.