Structure and photoluminescence properties of epitaxially oriented GaN nanorods grown on Si(111) by plasma-assisted molecular-beam epitaxy
2006; American Institute of Physics; Volume: 89; Issue: 24 Linguagem: Inglês
10.1063/1.2404597
ISSN1520-8842
AutoresHung-Ying Chen, Hon-Way Lin, Chang-Hong Shen, Shangjr Gwo,
Tópico(s)ZnO doping and properties
ResumoThe authors show that vertically c-axis-aligned GaN nanorod arrays grown by plasma-assisted molecular-beam epitaxy are epitaxially oriented on Si(111) substrates and their crystal structure corresponds to a fully relaxed wurtzite lattice. At later growth stage, these GaN nanorods exhibit the tendency to coalesce into nanorod bundles. Low-temperature photoluminescence spectrum from 1-μm-long GaN nanorods consists of intense exciton lines of strain-free bulk GaN and additional lines at ∼3.21 and ∼3.42eV (Y7 and Y2). The Y7 line is attributed to the excitons trapped along the dislocations at the boundaries of coalesced GaN nanorods, while the Y2 line has its origin in the interface defects at the GaN∕Si(111) interfaces.
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