Quantitative Micromagnetics at High Spatial Resolution Using Far-out-of-Focus STEM Electron Holography

1996; Wiley; Volume: 154; Issue: 2 Linguagem: Inglês

10.1002/pssa.2211540202

ISSN

1521-396X

Autores

Marián Maňkoš, J. M. Cowley, M. R. Scheinfein,

Tópico(s)

Advanced X-ray Imaging Techniques

Resumo

physica status solidi (a)Volume 154, Issue 2 p. 469-504 Review Article Quantitative Micromagnetics at High Spatial Resolution Using Far-out-of-Focus STEM Electron Holography M. Mankos, M. Mankos Department of Physics and Astronomy. Arizona State University, Tempe Search for more papers by this authorJ. M. Cowley, J. M. Cowley Department of Physics and Astronomy. Arizona State University, Tempe Search for more papers by this authorM. R. Scheinfein, Corresponding Author M. R. Scheinfein Department of Physics and Astronomy. Arizona State University, Tempe Department of Physics and Astronomy. Arizona State University, TempeSearch for more papers by this author M. Mankos, M. Mankos Department of Physics and Astronomy. Arizona State University, Tempe Search for more papers by this authorJ. M. Cowley, J. M. Cowley Department of Physics and Astronomy. Arizona State University, Tempe Search for more papers by this authorM. R. Scheinfein, Corresponding Author M. R. Scheinfein Department of Physics and Astronomy. Arizona State University, Tempe Department of Physics and Astronomy. Arizona State University, TempeSearch for more papers by this author First published: 16 April 1996 https://doi.org/10.1002/pssa.2211540202Citations: 23 Tempe, AZ 85287-1504, USA. AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat References 1 L. M. Falicov, D. T. Pierce, S. D. Bader, R. Gronsky, K. B. Hathaway, H. J. Hopster, D. N. Lambeth, S. S. P. Parkin, G. Prinz, M. Salamon, I. K. Schuller, and R. H. Victova, J. Mater. Res. 5, 1299 (1990). 2 F. Hellmann and E. M. Gyorgy, Phys. Rev. Letters 68, 1391 (1992). 3 V. G. Harris, K. D. Aylesworth, B. N. Das, W. T. Elam, and N. C. Koon, Phys. Rev. Letters 69, 1939 (1992). 4 C. Liu, E. R. Moog, and S. D. Bader, Phys. Rev. Letters 60, 2422 (1992). 5 B. N. Engel, M. H. Weidemann, R. A. Van Leuwen, and C. M. Falco, Phys. Rev. B 48, 9894 (1993). 6 S. S. Parkin, R. Bhadra, and K. P. Roche, Phys. Rev. Letters 66, 2152 (1991). 7 S. S. Parkin, Phys. Rev. Letters 67, 3598 (1991). 8 M. R. Scheinfein, J. Unguris, M. H. Kelley, D. T. Pierce, and R. J. Celotta, Rev. sci. Instrum. 61, 2501 (1990). 9 C. Kittel, Rev. mod. Phys. 21, 541 (1949). 10 L. D. Landau and E. Lifshitz, Phys. Z. Sowjet. 8, 135 (1935). 11 M. R. Scheinfein, J. Unguris, D. T. Pierce, and R. J. Celotta, J. appl. Phys. 67, 5932 (1990). 12 M. Altmann, Mater. Res. Soc. Symp. Proc. 232, 125 (1991). 13 R. Schaefer, B. E. Argyle, and P. L. Trouilloud, IEEE Trans. Magnetics 28, 2644 (1992). 14 A. Tonomura, Electron Holography, Springer-Verlag, Berlin/Heidelberg 1993. 15 L. J. Heyderman, J. N. Chapman, and S. S. P. Parkin, J. Magnetism magnetic Mater. 138, 344 (1994). 16 L. Reimer, Transmission Electron Microscopy, Springer-Verlag, Berlin 1984. 17 M. R. Scheinfein, J. Unguris, J. L. Blue, K. J. Coakley, D. T. Pierce, R. J. Celotta, and P. J. Ryan, Phys. Rev. B 43, 3395 (1991). 18 M. R. Scheinfein, P. J. Ryan, J. Unguris, D. T. Pierce, and R. J. Celotta, Appl. Phys. Letters 67, 1817 (1990). 19 M. Mankos, M. R. Scheinfein, and J. M. Cowley, J. appl. Phys. 75, 7418 (1994). 20 M. Mankos, Z. J. Yang, M. R. Scheinfein, and J. M. Cowley, IEEE Trans. Magnetics 30, 4497 (1994). 21 M. Mankos, P. de Haan, V. Kambersky, G. Matteucci, M. R. McCartney, Z. J. Yang, M. R. Scheinfein, and J. M. Cowley, in: Electron Holography, Delta Series, Ed. A. Tonomura, L. Allard, G. Pozzi, D. Joy, and Y. Ono, Elsevier Sci. Publ. B.V., 1995 (p. 329). 22 M. Mankos, M. R. Scheinfein, and J. M. Cowley, IEEE Trans. Magnetics 31, 3796 (1995). 23 J. M. Cowley, Appl. Phys. Letters 15, 58 (1969). 24 M. Mankos, S.-Y. Wang, J. K. Weiss, and J. M. Cowley, in: Proc. 50th Annu. Meet. Electron Microsc. Soc. Amer., Ed. G. W. Bailey, J. Bentley, and J. A. Small, San Francisco Press, San Francisco 1992 (p. 102). 25 P. W. Hawkes, Magnetic Electron Lenses, Springer-Verlag, Heidelberg 1992. 26 J. M. Cowley, Diffraction Physics, North-Holland Phys. Publ., Amsterdam 1986. 27 W. Ehrenberg and R. E. Siday, Proc. Phys. Soc. (London) B 62, 8 (1949). 28 Y. Aharonov and D. Bohm, Phys. Rev. 115, 485 (1959). 29 G. Möllenstedt and H. Düker, Z. Phys. 145, 377 (1956). 30 M. E. Hale, H. W. Fuller, and H. Rubinstein, J. appl. Phys. 30, 789 (1959). 31 Z. J. Yang and M. R. Scheinfein, Appl. Phys. Letters 66, 236 (1995). 32 J. T. Winthrop and C. R. Worthington, J. Opt. Soc. Amer. 56, 588 (1966). 33 M. S. Cohen, J. appl. Phys. 38, 4966 (1967). 34 L. Reimer, Transmission Electron Microscopy, Springer-Verlag, Berlin 1984. 35 P. Schwellinger, phys. stat. sol. (a) 36, 335 (1976). 36 D. C. Hotherstall, phys. stat. sol. (b) 51, 529 (1972). 37 R. H. Wade, Proc. Phys. Soc. 79, 1237 (1962). 38 N. H. Dekkers and H. de Lang, Optik 47, 452 (1974). 39 J. N. Chapman, P. E. Batson, E. M. Waddell, and R. P. Ferrier, Ultramicroscopy 3, 203 (1978). 40 J. N. Chapman and G. R. Morrison, J. Magnetism magnetic Mater. 35, 254 (1983). 41 J. N. Chapman, I. R. McFadyen, and S. McVitie, IEEE Trans. Magnetics 26, 1506 (1990). 42 J. M. Cowley, Ultramicroscopy 41, 335 (1992). 43 D. Gabor, Nature 161, 777 (1948). 44 D. Gabor, Proc. Roy. Soc. A 197, 454 (1949). 45 P. Hawkes and E. Kasper, Principles of Electron Optics: Wave Optics, Academic Press, London 1994. 46 E. N. Leith and J. Upatnieks, J. Opt. Soc. Amer. 52, 1123 (1962). 47 M. E. Haine and T. Mulvey, J. Opt. Soc. Amer. 42, 763 (1952). 48 L. Marton, Phys. Rev. 85, 1057 (1952). 49 H. Lichte, Adv. Opt. Electron Microscopy 12, 25 (1993). 50 E. J. Kirkland, Ultramicroscopy 15, 151 (1984). 51 D. van Dyck and M. Opdebeeck, in: Proc. 12th Internat. Congr. Electron Microscopy, Vol. 1, Ed. L. D. Peachey and D. B. Williams, San Francisco Press, San Francisco 1990 (p. 26). 52 A. Tonomura, Rev. mod. Phys. 59, 639 (1987). 53 S. Frabboni, G. Matteucci, and G. Pozzi, Ultramicroscopy 23, 29 (1987). 54 G. Möllenstedt and H. Wahl, Naturwissenschaften 55, 340 (1968). 55 M. Nicklaus and F. Hasselbach, Phys. Rev. A 48, 152 (1993). 56 F. Hasselbach and M. Nicklaus, Phys. Rev. A 48, 148 (1993). 57 J. C. H. Spence, in: Electron Diffraction Techniques, Ed. J. M. Cowley, Oxford Sci. Publ., Oxford 1992. 58 M. Mankos, A. A. Higgs, M. R. Scheinfein, and J. M. Cowley, Ultramicroscopy 58, 87 (1995). 59 J. K. Weiss, W. J. de Ruijter, M. Gajdardziska-Josifovska, M. R. McCartney, and D. J. Smith, Ultramicroscopy 50, 301 (1993). 60 M. R. McCartney, D. J. Smith, and B. Frost, Appl. Phys. Letters 65, 2603 (1994). 61 X. Zhang, D. C. Joy, Y. Zhang, T. Hashimoto, L. Allard, and T. A. Nolan, Ultramicroscopy 51, 21 (1993). 62 M. R. McCartney and M. Gajdardziska-Josifovska, Ultramicroscopy 53, 283 (1994). 63 R. F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope, Plenum Press, New York 1986. 64 J. M. Cowley, Ultramicroscopy 57, 327 (1995). 65 Th. Leuthner, H. Lichte, and K.-H. Herrmann, phys. stat. sol. (a) 116, 113 (1989). 66 C. Kittel, Phys. Rev. 70, 965 (1946). 67 M. S. Blois, J. appl. Phys. 26, 975 (1955). 68 H. Hoffman, IEEE Trans. Magnetics 4, 32 (1968). 69 D. J. Craik and R. S. Tebble, Ferromagnetism and Ferromagnetic Domains, North-Holland Publ. Co., Amsterdam 1965. 70 R. Carey and E. D. Isaac, Magnetic Domains and Techniques for Their Observation, Academic Press, New York/London 1966. 71 W. F. Brown, Micromagnetics, Robert E. Krieger Publ. Co., Huntington (NY) 1978. 72 A. E. LaBonte, J. appl. Phys. 34, 2450 (1969). 73 M. R. Scheinfein, J. Unguris, J. L. Blue, K. J. Coakley, D. T. Pierce, R. J. Celotta, and P. J. Ryan, Phys. Rev. B 43, 3395 (1991). 74 M. R. Scheinfein, J. Unguris, D. T. Pierce, and R. J. Celotta, J. appl. Phys. 67, 5932 (1990). 75 A. Hubert, J. appl. Phys. 46, 2276 (1975). 76 S. Semenov, Phys. Metals Metallogr. 75, 578 (1993). 77 M. E. Schabes and H. N. Betram, J. appl. Phys. 64, 1347 (1988). 78 M. R. Scheinfein and J. L. Blue, J. appl. Phys. 69, 7740 (1991). 79 M. N. Baibich, J. M. Broto, A. Fert, F. NguyenVan Dau, F. Petroff, P. Etienne, G. Creuzer, A. Frederich, and J. Chazelas, Phys. Rev. Letters 61, 2472 (1988). 80 S. S. P. Parkin, N. More, K. P. Roche, Phys. Rev. Letters 64, 2304 (1990). 81 P. Grunberg, J. Barnas, E. Saurenbach, J. A. Fuss, A. Wolf, and M. Vohl, J. Magnetism magnetic Mater. 93, 58 (1991). 82 S. S. P. Parkin, Phys. Rev. Letters 67, 3598 (1991). 83 P. M. Levy, S. Zhang, and A. Fert, Phys. Rev. Letters 65, 1643 (1990). 84 S. Zhang and P. M. Levy, Phys. Rev. B 47, 6776 (1993). 85 F. Giron, P. Boher, Ph. Houdy, P. Beauvillain, C. Chappert, K. LeDang and P. Vieillet, J. Magnetism magnetic Mater. 121, 3181 (1993). 86 P. P. Freitag, I. G. Trindade, L. V. Melo, J. L. Leal, N. Barradas, and J. L. Soares, J. appl. Phys. 73, 5527 (1993). 87 M. Rührig, R. Schäfer, A. Hubert, R. Mosler, J. A. Wolf, S. Demokritov, and P. Grünberg, phys. stat. sol. (a) 125, 635 (1991). 88 J. Unguris, R. J. Celotta, and D. T. Pierce, J. appl. Phys. 75, 6437 (1994). 89 J. N. Chapman, L. J. Heyderman, and S. S. P. Parkin, J. appl. Phys. 76, 881 (1994). 90 F. J. A. den Broeder, H. W. van Kesteren, W. Hoving, and W. B. Zeper, Appl. Phys. Letters 61, 1468 (1992). 91 Z. J. Yang and M. R. Scheinfein, Appl. Phys. Letters 66, 236 (1995). 92 Z. J. Yang and M. R. Scheinfein, Phys. Rev. B 52, 4263 (1995). 93 R. Ploessl, J. N. Chapman, M. R. Scheinfein, J. L. Blue, M. Mansuripur, and H. Hoffman, J. appl. Phys. 74, 7431 (1993). 94 A. Aharoni, Phys. Rev. B 45, 1030 (1992). 95 A. Aharoni, J. appl. Phys. 68, 2892 (1990). 96 J. L. Dormann and D. Fiorani (Ed.), Magnetic Properties of Fine Particles, Elsevier Sci. Publ. B.V., Amsterdam 1992. 97 A. Tasaki, M. Takao, and H. Tokunaga, Japan. J. appl. Phys. 13, 27 (1974). 98 J. Clarke, IEEE Trans. Electron Devices 27, 1896 (1980). 99 A. D. Kent, S. von Molnar, S. Gider, and D. D. Awschalom, J. appl. Phys. 76, 6656 (1994). Citing Literature Volume154, Issue216 April 1996Pages 469-504 ReferencesRelatedInformation

Referência(s)
Altmetric
PlumX