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Reconstruction of true topographies of solid surfaces in scanning electron microscopes using secondary electron

1987; Wiley; Volume: 9; Issue: 4 Linguagem: Inglês

10.1002/sca.4950090404

1932-8745

O. V. Kholodilov, A. Ya. Grigoryev, N. K. Myshkin,

Advanced Materials Characterization Techniques

ScanningVolume 9, Issue 4 p. 156-161 Original PaperFree to Read Reconstruction of true topographies of solid surfaces in scanning electron microscopes using secondary electron O. V. Kholodilov, Corresponding Author O. V. Kholodilov Institute of Mechanics of Metal-Polymer Systems of the BSSR Academy of Sciences, 32A Kirov Street, Gomel 246652, Union of Soviet Socialist RepublicsInstitute of Mechanics of Metal-Polymer Systems BSSR Academy of Sciences 32A Kirov St. Gomel 246652, Union of Soviet Socialist RepublicsSearch for more papers by this authorA. Ya. Grigoryev, A. Ya. Grigoryev Institute of Mechanics of Metal-Polymer Systems of the BSSR Academy of Sciences, 32A Kirov Street, Gomel 246652, Union of Soviet Socialist RepublicsSearch for more papers by this authorN. K. Myshkin, N. K. Myshkin Institute of Mechanics of Metal-Polymer Systems of the BSSR Academy of Sciences, 32A Kirov Street, Gomel 246652, Union of Soviet Socialist RepublicsSearch for more papers by this author O. V. Kholodilov, Corresponding Author O. V. Kholodilov Institute of Mechanics of Metal-Polymer Systems of the BSSR Academy of Sciences, 32A Kirov Street, Gomel 246652, Union of Soviet Socialist RepublicsInstitute of Mechanics of Metal-Polymer Systems BSSR Academy of Sciences 32A Kirov St. Gomel 246652, Union of Soviet Socialist RepublicsSearch for more papers by this authorA. Ya. Grigoryev, A. Ya. Grigoryev Institute of Mechanics of Metal-Polymer Systems of the BSSR Academy of Sciences, 32A Kirov Street, Gomel 246652, Union of Soviet Socialist RepublicsSearch for more papers by this authorN. K. Myshkin, N. K. Myshkin Institute of Mechanics of Metal-Polymer Systems of the BSSR Academy of Sciences, 32A Kirov Street, Gomel 246652, Union of Soviet Socialist RepublicsSearch for more papers by this author First published: 1987 https://doi.org/10.1002/sca.4950090404Citations: 11AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat References Carlsen IC: Reconstruction of true surface topographies in scanning electron microscopes using backscattered electrons. Scanning 4, 169–177 (1985) Derkach VP, Kyeshko GF, Kukharchuk MS: Electron Probe Devices. Naukova Dumka, Kiev (1974) 160 Everhart TE: Proc 3rd Annual Stereoscan Colloquium. Kent Cambridge Scientific, Morton Grove, IL (1970) 1 Goldstein LI, Yakowitz H: Practical Scanning Electron Microscopy. Plenum Press, New York (1975) 38 Kholodilov OV, Myshkin NK, Grigoryev A Ya: Microtopography evaluation with scanning electron microscope. Sov J Friction Wear 4, 133–136 (1985) Lane WC: Proc 3rd Annual Stereoscan Colloquium. Kent Cambridge Scientific, Morton Grove, IL, (1970) 83 Lange M, Reimer L, Tollkamp C: Testing of detector strategies in scanning electron microscopy by isodensities. J Microsc 134, 1–12 (1984) Lebiedzik J: An automatic topographical surface reconstruction in SEM. Scanning 2, 230–237 (1979) Oatley CW, Nixon WC, Pease PFW: Advances in Electronics and Electron Physics. (Ed. L Marton). Academic Press, New York (1965) 81 Raski JZ: The measurement of texture using backscattered electrons. Ph.D. thesis, University of Michigan, Ann Arbor, 1986 Sasov Yu A: Microtomography and digital processing of images using an Iskra-226 microcomputer. Microproc Dev Sys 1, 53–58 (1986) Citing Literature Volume9, Issue41987Pages 156-161 ReferencesRelatedInformation