Determination of Burgers Vector of Screw Dislocations in 6H-SiC Single Crystals by Synchrotron White Beam X-Ray Topography
1996; Cambridge University Press; Volume: 437; Linguagem: Inglês
10.1557/proc-437-129
ISSN1946-4274
AutoresWei Si, Michael Dudley, C. Carter, R Glass, V. F. Tsvetkov,
Tópico(s)Silicon Carbide Semiconductor Technologies
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