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The comparison scanning electron microscope first experiments in forensic application

1980; Wiley; Volume: 3; Issue: 3 Linguagem: Inglês

10.1002/sca.4950030310

1932-8745

R Goebel, K. D. Gross, H. Katterwe, W. Kammrath,

Integrated Circuits and Semiconductor Failure Analysis

ScanningVolume 3, Issue 3 p. 193-201 Original PaperFree to Read The comparison scanning electron microscope first experiments in forensic application R. Goebel, R. Goebel Forensic Institute of the Bundeskriminalamt, D-6200 Wiesbaden, FRGSearch for more papers by this authorK. D. Gross, K. D. Gross Forensic Institute of the Bundeskriminalamt, D-6200 Wiesbaden, FRGSearch for more papers by this authorH. Katterwe, H. Katterwe Forensic Institute of the Bundeskriminalamt, D-6200 Wiesbaden, FRGSearch for more papers by this authorW. Kammrath, W. Kammrath H. Raith KG, Harnackstraße 35a, D-4600 Dortmund, FRG (previously Cambridge Instrument Company GmbH, German Office)Search for more papers by this author R. Goebel, R. Goebel Forensic Institute of the Bundeskriminalamt, D-6200 Wiesbaden, FRGSearch for more papers by this authorK. D. Gross, K. D. Gross Forensic Institute of the Bundeskriminalamt, D-6200 Wiesbaden, FRGSearch for more papers by this authorH. Katterwe, H. Katterwe Forensic Institute of the Bundeskriminalamt, D-6200 Wiesbaden, FRGSearch for more papers by this authorW. Kammrath, W. Kammrath H. Raith KG, Harnackstraße 35a, D-4600 Dortmund, FRG (previously Cambridge Instrument Company GmbH, German Office)Search for more papers by this author First published: 1980 https://doi.org/10.1002/sca.4950030310Citations: 2AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat References Goebel R: Das Rasterelektronenmikroskop, ein neues Untersuchungsgerät für die Kriminaltechnik. Kriminalistik 9, 389–391 (1973) Goebel R: Examination of incandescent bulbs of motor vehicles after road accidents. Scanning Electron Microscopy, 1975 IITRI, Chicago, pp 339–350 Hantsche H: Zur Anwendung des REM in der Kriminaltechnik. BEDO 4–2, 641–656, Remy, Münster 1971 Raith H, Schmeisser H: Quantitative Rastermikroskopie. BEDO 10, 717–722, Remy, Münster 1977 Van Essen GG, Morgan JE: A split field comparison SEM. Scanning Electron Microscopy 1973, IITRI, Chicago, pp 339–350 Judd G et al.: A topographical comparison imaging system for SEM applications. Scanning Electron Microscopy 1973, IITRI, Chicago, pp 339–350 Citing Literature Volume3, Issue31980Pages 193-201 ReferencesRelatedInformation