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Direct Probing of Nanodimensioned Oxide Multilayers with the Aid of Focused Ion Beam Milling

2011; Volume: 23; Issue: 39 Linguagem: Inglês

10.1002/adma.201102401

1521-4095

Yener Kuru, Helia Jalili, Zhuhua Cai, Bilge Yildiz, Harry L. Tuller,

Ferroelectric and Piezoelectric Materials

Advanced MaterialsVolume 23, Issue 39 p. 4543-4548 Communication Direct Probing of Nanodimensioned Oxide Multilayers with the Aid of Focused Ion Beam Milling Yener Kuru, Corresponding Author Yener Kuru [email protected] Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA Yener Kuru, Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA Bilge Yildiz, Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA Harry L. Tuller, Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA.Search for more papers by this authorHelia Jalili, Helia Jalili Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USASearch for more papers by this authorZhuhua Cai, Zhuhua Cai Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USASearch for more papers by this authorBilge Yildiz, Corresponding Author Bilge Yildiz [email protected] Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA Yener Kuru, Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA Bilge Yildiz, Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA Harry L. Tuller, Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA.Search for more papers by this authorHarry L. Tuller, Corresponding Author Harry L. Tuller [email protected] Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA Yener Kuru, Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA Bilge Yildiz, Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA Harry L. Tuller, Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA.Search for more papers by this author Yener Kuru, Corresponding Author Yener Kuru [email protected] Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA Yener Kuru, Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA Bilge Yildiz, Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA Harry L. Tuller, Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA.Search for more papers by this authorHelia Jalili, Helia Jalili Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USASearch for more papers by this authorZhuhua Cai, Zhuhua Cai Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USASearch for more papers by this authorBilge Yildiz, Corresponding Author Bilge Yildiz [email protected] Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA Yener Kuru, Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA Bilge Yildiz, Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA Harry L. Tuller, Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA.Search for more papers by this authorHarry L. Tuller, Corresponding Author Harry L. Tuller [email protected] Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA Yener Kuru, Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA Bilge Yildiz, Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA Harry L. Tuller, Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA.Search for more papers by this author First published: 08 September 2011 https://doi.org/10.1002/adma.201102401Citations: 11Read the full textAboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinkedInRedditWechat Graphical Abstract The La0.65Sr0.35MnO3 (LSM)/SrTi0.2Fe0.8O3 (STF) multilayer is observed using scanning probe microscopy following a focused-ion beam milling process with shallow incidence angle. Although the nominal thickness of each layer is about 5 nm, the exposed layers are magnified by several orders of magnitude on the surface after FIB cutting. This procedure enables high spatial resolution and coordinated property measurements directly on the inner layers and at their interfaces. Citing Literature Volume23, Issue39October 18, 2011Pages 4543-4548 RelatedInformation