Dynamic force microscopy in fluid
1999; Wiley; Volume: 27; Issue: 5-6 Linguagem: Romeno
10.1002/(sici)1096-9918(199905/06)27
ISSN1096-9918
AutoresMark A. Lantz, Y. Z. Liu, Xiaodong Cui, Hiroshi Tokumoto, Stuart Lindsay,
Tópico(s)Adhesion, Friction, and Surface Interactions
ResumoSurface and Interface AnalysisVolume 27, Issue 5-6 p. 354-360 Research Article Dynamic force microscopy in fluid M. Lantz, M. Lantz Joint Research Center for Atom Technology, c/o National Institute for Advanced Interdisciplinary Research, 1-1-4 Higashi, Tsukuba, Ibaraki 305-0046, JapanSearch for more papers by this authorY. Z. Liu, Y. Z. Liu Department of Physics and Astronomy, Arizona State University, Tempe, AZ 85287-1504, USASearch for more papers by this authorX. D. Cui, X. D. Cui Department of Physics and Astronomy, Arizona State University, Tempe, AZ 85287-1504, USASearch for more papers by this authorH. Tokumoto, H. Tokumoto Joint Research Center for Atom Technology, c/o National Institute for Advanced Interdisciplinary Research, 1-1-4 Higashi, Tsukuba, Ibaraki 305-0046, JapanSearch for more papers by this authorS. M. Lindsay, Corresponding Author S. M. Lindsay Department of Physics and Astronomy, Arizona State University, Tempe, AZ 85287-1504, USADepartment of Physics and Astronomy, Arizona State University, Tempe, AZ 85287-1504, USASearch for more papers by this author M. Lantz, M. Lantz Joint Research Center for Atom Technology, c/o National Institute for Advanced Interdisciplinary Research, 1-1-4 Higashi, Tsukuba, Ibaraki 305-0046, JapanSearch for more papers by this authorY. Z. Liu, Y. Z. Liu Department of Physics and Astronomy, Arizona State University, Tempe, AZ 85287-1504, USASearch for more papers by this authorX. D. Cui, X. D. Cui Department of Physics and Astronomy, Arizona State University, Tempe, AZ 85287-1504, USASearch for more papers by this authorH. Tokumoto, H. Tokumoto Joint Research Center for Atom Technology, c/o National Institute for Advanced Interdisciplinary Research, 1-1-4 Higashi, Tsukuba, Ibaraki 305-0046, JapanSearch for more papers by this authorS. M. Lindsay, Corresponding Author S. M. Lindsay Department of Physics and Astronomy, Arizona State University, Tempe, AZ 85287-1504, USADepartment of Physics and Astronomy, Arizona State University, Tempe, AZ 85287-1504, USASearch for more papers by this author First published: 20 May 1999 https://doi.org/10.1002/(SICI)1096-9918(199905/06)27:5/6 3.0.CO;2-4Citations: 57AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat Abstract Low-amplitude dynamic force microscopy can operate in a non-contact mode, sensing changes in liquid properties near a surface. Operation of the microscope in water at the higher amplitudes often required for stable imaging has been investigated. When driven by direct application of a force to the tip, the microscope is stable over a wide range of operating frequencies. At low frequency, the interfacial stiffness extracted from approach curves is found to be of the order of 1 N m−1 on first contact, which is indicative of imaging via a compressed liquid layer. Measurements of the spectral response of the cantilever and numerical simulations confirm this and show that viscous damping at the surface also plays a role. Copyright © 1999 John Wiley & Sons, Ltd. REFERENCES 1. J. Tamayo and R. Garcia, Langmuir 12, 4430 (1996). 10.1021/la960189l CASWeb of Science®Google Scholar 2. J. Tamayo and R. Garcia, App. Phys. Lett. 71, 2394 (1997). 10.1063/1.120039 CASWeb of Science®Google Scholar 3. B. Anczykowski, D. Kruger, K. L. Babcock and H. 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