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X-ray diffraction from close-packed structures with stacking faults. II. hhc crystals

1974; International Union of Crystallography; Volume: 30; Issue: 6 Linguagem: Inglês

10.1107/s0567739474001720

1600-8596

S. Lele,

X-ray Spectroscopy and Fluorescence Analysis

The kinematical theory of X-ray diffraction by hhc (samarium-type) crystals with growth and deformation faults is developed. The intensity distribution in reciprocal space is derived as a function of five parameters which represent three growth and two deformation fault probabilities. Only reflexions with H - K ≠ 3N, N an integer, are affected by faulting and exhibit generally changes in integrated intensity, profile peak shift, broadening and asymmetry. It is shown that nine independent combinations of the five fault probabilities can be evaluated from the measured profile characteristics.