Orientation imaging microscopy: application to the measurement of grain boundary structure
1993; Elsevier BV; Volume: 166; Issue: 1-2 Linguagem: Inglês
10.1016/0921-5093(93)90310-b
ISSN1873-4936
Autores Tópico(s)Advanced Materials Characterization Techniques
ResumoThe method of orientation imaging microscopy (OIM), which utilizes rapid, direct measurements of local lattice orientation on a grid of points fixed upon flat surfaces sectioned from polycrystals, is described, and connected with established stereological theory. Examples of OIM applied to an Fe-2wt.%Si alloy are presented. Procedures associated with the Sv/PL stereology are extended to obtain a new Sv/f2 stereology linking two-point statistics of lattice orientation with the distribution of grain boundary structure. The chief advantage of the new stereology is that it can be implemented directly from OIM. It is shown that the reliability of the method depends, not only on the number of sectioned surfaces interrogated (as is the case with established Sv/PL stereology), but also on the magnitude of the spacing between grid points.
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