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Electron Beam-Induced Sample Contamination in the SEM

2005; Oxford University Press; Volume: 11; Issue: S02 Linguagem: Inglês

10.1017/s1431927605507785

1435-8115

András Vladár, Michael T. Postek,

X-ray Spectroscopy and Fluorescence Analysis

Extract HTML view is not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button. Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005