Investigation on Degradation in Long-Term Operations of Four Different Stack/Modules
2007; Institute of Physics; Volume: 7; Issue: 1 Linguagem: Inglês
10.1149/1.2729082
ISSN2151-2051
AutoresHarumi Yokokawa, Takao Watanabe, Akira UENO, Koji Hoshino,
Tópico(s)Semiconductor materials and devices
ResumoInvestigation on degradation of performance during long term operations of four different SOFC stacks/modules has been initiated in the NEDO SOFC project from 2005FY to 2007FY. Four stack/modules with different designs and materials have been tested for about 5000 h and have been dissected for post- operation examination. In addition to normal visual and microscopic inspection, SIMS was used as strong tool of detecting those mass transfer phenomena which may lead to degradations. Examinations were made first on those stack materials which were operated for 24 h. Impurity levels in the cell components were detected and extent of the interdiffusion across the interface of the cell components was determined. Further analyses were made by using SIMS on those stack materials operated for around 5000 h.
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