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Artigo Revisado por pares
BIBTEX RIS

Determination of exposure to engineered carbon nanoparticles using a self-sensing piezoresistive silicon cantilever sensor

2012; Springer Science+Business Media; Volume: 18; Issue: 7-8 Linguagem: Inglês

10.1007/s00542-011-1405-9

ISSN

1432-1858

Autores

Hutomo Suryo Wasisto, Stephan Merzsch, A. Waag, I. Kirsch, Erik Uhde, Tunga Salthammer, Erwin Peiner,

Tópico(s)

Advanced MEMS and NEMS Technologies

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