High-Fidelity Transport of Trapped-Ion Qubits through an X -Junction Trap Array
2009; American Physical Society; Volume: 102; Issue: 15 Linguagem: Inglês
10.1103/physrevlett.102.153002
ISSN1092-0145
AutoresR. B. Blakestad, C. Ospelkaus, Aaron P. VanDevender, Jason M. Amini, J. Britton, D. Leibfried, D. J. Wineland,
Tópico(s)Atomic and Subatomic Physics Research
ResumoWe report reliable transport of (9)Be(+) ions through an "X junction" in a 2D trap array that includes a separate loading and reservoir zone. During transport the ion's kinetic energy in its local well increases by only a few motional quanta and internal-state coherences are preserved. We also examine two sources of energy gain during transport: a particular radio-frequency noise heating mechanism and digital sampling noise. Such studies are important to achieve scaling in a trapped-ion quantum information processor.
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