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Quantification of the Recrystallized Fraction in a Nickelbase-Alloy from EBSD-Data

2003; Oxford University Press; Volume: 9; Issue: S03 Linguagem: Inglês

10.1017/s1431927603026229

1435-8115

Stefan Mitsche, Peter Poelt, Christof Sommitsch, Michael J. Walter,

Electron and X-Ray Spectroscopy Techniques

Journal Article Quantification of the Recrystallized Fraction in a Nickelbase-Alloy from EBSD-Data Get access S Mitsche, S Mitsche Research Institute for Electron Microscopy, Graz University of Technology, Steyrergasse 17, A-8010 Graz, Austria Search for other works by this author on: Oxford Academic Google Scholar P Poelt, P Poelt Research Institute for Electron Microscopy, Graz University of Technology, Steyrergasse 17, A-8010 Graz, Austria Search for other works by this author on: Oxford Academic Google Scholar C Sommitsch, C Sommitsch Böhler Edelstahl GmbH & Co KG, Postfach 96, A-8605 Kapfenberg, Austria Search for other works by this author on: Oxford Academic Google Scholar M Walter M Walter Böhler Edelstahl GmbH & Co KG, Postfach 96, A-8605 Kapfenberg, Austria Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 9, Issue S03, 1 September 2003, Pages 344–345, https://doi.org/10.1017/S1431927603026229 Published: 05 September 2003