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Optical characterization of individual semiconductor nanostructures using a scanning tunneling microscope

2004; Oxford University Press; Volume: 53; Issue: 2 Linguagem: Inglês

10.1093/jmicro/53.2.169

1477-9986

Tohru Tsuruoka, S. Ushioda,

Advanced Materials Characterization Techniques

Journal Article Optical characterization of individual semiconductor nanostructures using a scanning tunneling microscope Get access Tohru Tsuruoka, Tohru Tsuruoka *To whom correspondence should be addressed. E-mail: tsuruoka@ushioda.riec.tohoku.ac.jp Search for other works by this author on: Oxford Academic PubMed Google Scholar Sukekatsu Ushioda Sukekatsu Ushioda Search for other works by this author on: Oxford Academic PubMed Google Scholar Journal of Electron Microscopy, Volume 53, Issue 2, April 2004, Pages 169–175, https://doi.org/10.1093/jmicro/53.2.169 Published: 01 April 2004 Article history Received: 12 November 2003 Accepted: 07 January 2004 Published: 01 April 2004