X-ray microscopes at BESSY II
2000; American Institute of Physics; Linguagem: Inglês
10.1063/1.1291181
ISSN1935-0465
Autores Tópico(s)Advanced X-ray Imaging Techniques
ResumoViews Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation P. Guttmann, B. Niemann, J. Thieme, U. Wiesemann, D. Rudolph, G. Schmahl; X-ray microscopes at BESSY II. AIP Conf. Proc. 15 May 2000; 507 (1): 411–415. https://doi.org/10.1063/1.1291181 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioAIP Conference Proceedings Search Advanced Search |Citation Search
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