Surface film X‐ray microanalysis
1990; Wiley; Volume: 12; Issue: 4 Linguagem: Inglês
10.1002/sca.4950120407
ISSN1932-8745
Autores Tópico(s)Surface and Thin Film Phenomena
ResumoScanningVolume 12, Issue 4 p. 212-224 ArticleFree to Read Surface film X-ray microanalysis J. L. Pouchou, Corresponding Author J. L. Pouchou Office National d'Etudes et de Recherches Aérospatiales, Chǎtillon, FranceOffice National d'Etudes et de Recherches Aérospatiales B.P. 72 92322 Chǎtillon Cedex, FranceSearch for more papers by this authorF. Pichoir, F. Pichoir Office National d'Etudes et de Recherches Aérospatiales, Chǎtillon, FranceSearch for more papers by this author J. L. Pouchou, Corresponding Author J. L. Pouchou Office National d'Etudes et de Recherches Aérospatiales, Chǎtillon, FranceOffice National d'Etudes et de Recherches Aérospatiales B.P. 72 92322 Chǎtillon Cedex, FranceSearch for more papers by this authorF. Pichoir, F. Pichoir Office National d'Etudes et de Recherches Aérospatiales, Chǎtillon, FranceSearch for more papers by this author First published: July/August 1990 https://doi.org/10.1002/sca.4950120407Citations: 84AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat Citing Literature Volume12, Issue4July/August 1990Pages 212-224 RelatedInformation
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