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Aberration-Corrected Z-Contrast Scanning Transmission Electron Microscopy of CdSe Nanocrystals

2004; American Chemical Society; Volume: 4; Issue: 7 Linguagem: Inglês

10.1021/nl049406q

1530-6992

James R. McBride, Tadd Kippeny, Stephen J. Pennycook, Sandra J. Rosenthal,

Copper-based nanomaterials and applications

Aberration-corrected atomic number contrast scanning transmission electron microscopy (Z-STEM) was used to study CdSe nanocrystals prepared using different surfactants. With an optimal probe size of 0.8 Å, unprecedentedly detailed images of the nanocrystal's lattice structure and surface morphology were obtained. This level of detail is important for the characterization of nanomaterials because of the high sensitivity of the nanocrystal's properties to minute changes in structure. As an example of the power of this technique, a sample of CdSe nanocrystals prepared using trioctylphosphine oxide (TOPO) as the surfactant was compared to a sample of CdSe prepared using a mixture of TOPO and hexadecylamine (HDA). Z-STEM reveals striking differences in nanocrystal morphology as the result of the addition of HDA.