General transfer-matrix method for optical multilayer systems with coherent, partially coherent, and incoherent interference
2002; Optica Publishing Group; Volume: 41; Issue: 19 Linguagem: Inglês
10.1364/ao.41.003978
ISSN0003-6935
AutoresC. Katsidis, Dimitrios I. Siapkas,
Tópico(s)Advanced Surface Polishing Techniques
ResumoThe optical response of coherent thin-film multilayers is often represented with Fresnel coefficients in a 2 x 2 matrix configuration. Here the usual transfer matrix was modified to a generic form, with the ability to use the absolute squares of the Fresnel coefficients, so as to include incoherent (thick layers) and partially coherent (rough surface or interfaces) reflection and transmission. The method is integrated by use of models for refractive-index depth profiling. The utility of the method is illustrated with various multilayer structures formed by ion implantation into Si, including buried insulating and conducting layers, and multilayers with a thick incoherent layer in an arbitrary position.
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