Sampling Protein Form and Function with the Atomic Force Microscope
2010; Elsevier BV; Volume: 9; Issue: 8 Linguagem: Inglês
10.1074/mcp.r110.001461
ISSN1535-9484
AutoresMarian Baclayon, Wouter H. Roos, Gijs J. L. Wuite,
Tópico(s)Ion-surface interactions and analysis
ResumoTo study the structure, function, and interactions of proteins, a plethora of techniques is available. Many techniques sample such parameters in non-physiological environments (e.g. in air, ice, or vacuum). Atomic force microscopy (AFM), however, is a powerful biophysical technique that can probe these parameters under physiological buffer conditions. With the atomic force microscope operating under such conditions, it is possible to obtain images of biological structures without requiring labeling and to follow dynamic processes in real time. Furthermore, by operating in force spectroscopy mode, it can probe intramolecular interactions and binding strengths. In structural biology, it has proven its ability to image proteins and protein conformational changes at submolecular resolution, and in proteomics, it is developing as a tool to map surface proteomes and to study protein function by force spectroscopy methods. The power of AFM to combine studies of protein form and protein function enables bridging various research fields to come to a comprehensive, molecular level picture of biological processes. We review the use of AFM imaging and force spectroscopy techniques and discuss the major advances of these experiments in further understanding form and function of proteins at the nanoscale in physiologically relevant environments. To study the structure, function, and interactions of proteins, a plethora of techniques is available. Many techniques sample such parameters in non-physiological environments (e.g. in air, ice, or vacuum). Atomic force microscopy (AFM), however, is a powerful biophysical technique that can probe these parameters under physiological buffer conditions. With the atomic force microscope operating under such conditions, it is possible to obtain images of biological structures without requiring labeling and to follow dynamic processes in real time. Furthermore, by operating in force spectroscopy mode, it can probe intramolecular interactions and binding strengths. In structural biology, it has proven its ability to image proteins and protein conformational changes at submolecular resolution, and in proteomics, it is developing as a tool to map surface proteomes and to study protein function by force spectroscopy methods. The power of AFM to combine studies of protein form and protein function enables bridging various research fields to come to a comprehensive, molecular level picture of biological processes. We review the use of AFM imaging and force spectroscopy techniques and discuss the major advances of these experiments in further understanding form and function of proteins at the nanoscale in physiologically relevant environments. To understand biological processes at the molecular level it is essential to identify the involved proteins and proteinaceous assemblies, to characterize their structure and function, and to unravel their interplay with other proteins and molecules (1.Heck A.J. Native mass spectrometry: a bridge between interactomics and structural biology.Nat. Methods. 2008; 5: 927-933Crossref PubMed Scopus (511) Google Scholar). Techniques like x-ray crystallography, electron microscopy, nuclear magnetic resonance spectroscopy, and mass spectrometry have contributed massively to elucidate such protein properties. These techniques can easily sample the properties of a large ensemble of proteins; however, they require subjecting the sample to harsh treatments such as drying, crystallizing, or vaporizing in vacuum, thereby limiting the range of measurable dynamical properties of the sample. One powerful method that permits the investigation of molecules in their native physiological buffer condition is atomic force microscopy (AFM) 1The abbreviations used are:AFMatomic force microscopyCCMVcowpea chlorotic mottle virusHBVhepatitis B virusMVMminute virus of miceMDmolecular dynamics. (2.Binnig G. Quate C.F. Gerber C. Atomic force microscope.Phys. Rev. Lett. 1986; 56: 930-933Crossref PubMed Scopus (11692) Google Scholar). An atomic force microscope is a microscope and force spectrometer at the same time. The imaging resolution of the atomic force microscope is comparable with that of electron microscopes, and it has the special capability to image samples in a variety of environments such as in vacuum, air, or liquid, which therefore enables studying biological specimens in their native environments (i.e. in buffer solutions) (3.Fechner P. Boudier T. Mangenot S. Jaroslawski S. Sturgis J.N. Scheuring S. 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In the following, we will explain the principles of atomic force microscopy and its different operation modes and finally discuss examples of imaging, nanoindentation, and protein (un)binding and unfolding studies using AFM. The atomic force microscope is a member of the scanning probe microscopy techniques that utilize a probing tip that scans the surface of a sample. The measured interaction between the sample and the probe (e.g. current in scanning tunneling microscopy or force in AFM) renders a three-dimensional image of the sample surface. In AFM, the probe is a sharp tip with a typical radius of about 1–20 nm mounted on a cantilever. The interaction between the sample and the tip is recorded by the bending of the cantilever as shown in Fig. 1. The deflection of the cantilever is monitored by the change in direction of the reflected light (laser), which is recorded by a position-sensitive detector (quadrant photodiode). Soft cantilevers with spring constants of about 0.01–0.1 newton/m can sense forces as low as a few piconewtons, whereas modern piezoelectric scanners can translate the sample or tip in x-, y-, and z-directions with subnanometer resolutions. This combined functionality provides the atomic force microscope with the capability of rendering three-dimensional images of the sample with atomic resolution and manipulating them at single molecular level with nanoscale forces (34.Binnig G. Gerber C. Stoll E. Albrecht T.R. Quate C.F. Atomic resolution with atomic force microscope.Europhys. Lett. 1987; 3: 1281-1286Crossref Google Scholar, 35.Giessibl F.J. Binnig G. Investigation of the (001) cleavage plane of potassium-bromide with an atomic force microscope at 4.2-k in ultra-high vacuum.Ultramicroscopy. 1992; 42: 281-289Crossref Scopus (83) Google Scholar, 36.Parot P. Dufrêne Y.F. Hinterdorfer P. Le Grimellec C. Navajas D. Pellequer J.L. Scheuring S. 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A review of atomic force microscopy imaging systems: application to molecular metrology and biological sciences.Mechatronics. 2004; 14: 907-945Crossref Scopus (0) Google Scholar). The different operation modes can be divided into static and dynamic categories (41.Morris V.J. Kirby A.R. Gunning A.P. Atomic Force Microscopy for Biologists. 2nd Ed. Imperial College Press, London2010Google Scholar, 42.Garcia R. Perez R. Dynamic atomic force microscopy methods.Surf. Sci. Rep. 2002; 47: 197-301Crossref Google Scholar, 43.Braga P.C. Ricci D. Atomic Force Microscopy: Biomedical Methods and Applications. Humana Press, Totowa, NJ2004Google Scholar). In static imaging mode, the sample is brought into physical contact with the tip until their interaction reaches a condition where it satisfies a predefined parameter setting, such as the specified z-position of the sample (constant height mode) or the amount of interaction force between the tip and sample (constant force mode). In constant height mode, the sample is moved in x-y direction while maintaining its z-position. The surface or height information of the sample is reconstructed from the deflection of the cantilever, thus the measured contact force. However, because the distance between the tip and sample is fixed, lateral dragging of the sample during imaging is quite common. In constant force mode, it is the imaging force that is set on a fixed value. The sample is brought in contact with the tip by moving the piezoelectric scanner in the z-direction until the contact force reaches the set value. The height of the sample at that position is then determined by how much the sample was moved in z. The tip is then moved to the next x-y position and using a feedback mechanism will retract or approach the sample until the set contact force is obtained. The constant force mode provides a careful and cautious way of handling the sample by setting the contact force to a minimum. However, the cantilever normally moves laterally in a continuous manner, and therefore the retraction or approach during feedback can still impart considerable dragging or damage during these lateral movements, especially in imaging soft biological samples. An alternative way of performing the constant force imaging mode is called jumping mode. This mode provides a safer scheme by retracting the tip to a defined height away from the sample before moving on to the next lateral x-y position (44.de Pablo P.J. Colchero J. Gomez-Herrero J. Baro A.M. Jumping mode scanning force microscopy.Appl. Phys. Lett. 1998; 73: 3300-3302Crossref Scopus (148) Google Scholar). With this mode, there is less probability of dragging the sample laterally because each time it moves to another position it is first retracted away from the sample surface, which could be set such that it is above the highest structural feature. In addition, because it also operates in contact force mode, the tip-sample interaction force can be preset to the lowest possible value, thereby preventing damage to the sample. In dynamic imaging mode, the tip is made to oscillate while it approaches the sample. The change in the oscillation amplitude or frequency during approach is used to construct its surface information. In this mode, the tip can be intermittently touching the sample (tapping mode) or not touching the sample at all (non-contact dynamic mode). In tapping mode, the contact between the tip and sample is minimized by oscillating the cantilever so that the tip bounces up and down and therefore only "taps" the surface as it moves around the sample (45.Zhong Q. Inniss D. Kjoller K. Elings V.B. Fractured polymer silica fiber surface studied by tapping mode atomic force microscopy.Surf. Sci. 1993; 290: L688-L692Crossref Scopus (0) Google Scholar). The cantilever is made to oscillate lower than the natural resonance frequency; but when it approaches the sample, the resonance frequency decreases because of damping effects. The result is an amplitude increase because the driving frequency is now closer to the new resonance. Finally, the oscillation amplitude decreases again when the tip hits the sample. The monitored change in the oscillation amplitude is used as the feedback signal for constructing the image of the sample surface. In non-contact dynamic mode, the tip is never in contact with the sample. To implement this, the cantilever is made to oscillate at a frequency higher than resonance. As it approaches the sample, its amplitude of oscillation decreases because of damping: the closer it is to the sample, the lower its amplitude of oscillation. The tip is prevented from coming too close to the sample by setting a limit on the lowest possible oscillation amplitude. As with tapping mode, this parameter is used as the feedback signal for image construction. The dynamic modes provide the option of little physical contact with the sample during imaging. In force spectroscopy, the atomic force microscope is operating in the force-distance measurement mode (46.Cappella B. Dietler G. Force-distance curves by atomic force microscopy.Surf. Sci. Rep. 1999; 34: 1-104Crossref Google Scholar, 47.Butt H.J. Cappella B. Kappl M. Force measurements with the atomic force microscope: technique, interpretation and applications.Surf. Sci. Rep. 2005; 59: 1-152Crossref Scopus (2438) Google Scholar). In this mode, the force is now specifically monitored and recorded as the tip is brought into contact (e.g. pushing/indentation experiments) or out of contact from the sample (e.g. unbinding and stretching experiments) while simultaneously recording the amount of distance of approach or retraction of the tip. In this mode, no lateral movement is performed during the approach and retraction cycles. Typical applications of the spectroscopy mode in protein studies are in pushing or nanoindentation of viruses and microtubules to probe their mechanical properties (32.Roos W.H. Wuite G.L. Nanoindentation studies reveal material properties of viruses.Adv. Mater. 2009; 21: 1187-1192Crossref Scopus (54) Google Scholar, 33.Kasas S. Dietler G. Probing nanomechanical properties from biomolecules to living cells.Pflugers Arch. 2008; 456: 13-27Crossref PubMed Scopus (78) Google Scholar, 48.de Pablo P.J. Schaap I.A. MacKintosh F.C. Schmidt C.F. Deformation and collapse of microtubules on the nanometer scale.Phys. Rev. Lett. 2003; 91 (098101)Crossref Scopus (195) Google Scholar) and in pulling or stretching experiments to measure the (un)binding strength of two protein molecules (49.Chilkoti A. Boland T. Ratner B.D. Stayton P.S. 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At the instance the tip touches the sample surface, the cantilever starts to bend, and the force-distance curve starts to rise as the tip pushes further on the sample. When the tip is retracted, the retraction curve may simply trace back the curve during approach (in the case of a hard surface), or it retraces a completely different curve depending on the properties of the sample (37.Zlatanova J. Leuba S.H. Stretching and imaging single DNA molecules and chromatin.J. Muscle Res. Cell Motil. 2002; 23: 377-395Crossref PubMed Scopus (0) Google Scholar, 47.Butt H.J. Cappella B. Kappl M. Force measurements with the atomic force microscope: technique, interpretation and applications.Surf. Sci. Rep. 2005; 59: 1-152Crossref Scopus (2438) Google Scholar, 60.Vinckier A. Gervasoni P. Zaugg F. Ziegler U. Lindner P. Groscurth P. Plückthun A. Semenza G. Atomic force microscopy detects changes in the interaction forces between GroEL and substrate proteins.Biophys. 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For the cantilever calibration, there are three different methods in measuring its spring constant: dimensional, static, and dynamic methods. Dimensional methods calculate the spring constant based on the physical dimensions and material properties of the cantilever (62.Senden T.J. Ducker W.A. Experimental determination of spring constants in atomic force microscopy.Langmuir. 1994; 10: 1003-1004Crossref Google Scholar, 63.Clifford C.A. Seah M.P. The determination of atomic force microscope cantilever spring constants via dimensional methods for nanomechanical analysis.Nanotechnology. 2005; 16: 1666-1680Crossref Scopus (146) Google Scholar), and the static method is based on the deflection of the cantilever in response to a known force (64.Chen G.Y. Warmack R.J. Thundat T. Allison D.P. Huang A. Resonance response of scanning force microscopy cantilevers.Rev. Sci. Instrum. 1994; 65: 2532-2537Crossref Scopus (0) Google Scholar, 65.Albrecht T.R. Akamine S. Carver T.E. Quate C.F. 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Force calibration is usually implemented by pushing the tip on a hard surface such as a mica or glass substrate. This curve measures the deflection due to the cantilever alone, referred to as the glass curve in Fig. 2.
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