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On the geometrical relationship between tilt and twist grain boundaries

1989; De Gruyter; Volume: 189; Issue: 1-4 Linguagem: Inglês

10.1524/zkri.1989.189.14.239

2196-7105

D. Wolf, James F. Lutsko,

Surface and Thin Film Phenomena

Within the framework of the coincident-site lattice (CSL) description of grain boundaries (GBs), the five macroscopic degrees of freedom (dof) are usually chosen to consist of a rotation axis and angle and the GB-plane normal. A different method is proposed for the characterization of these five independent parameters, by replacing the CSL misorientation by the GB-plane normals in the two halves of the bicrystal and by the twist component of the misorientation. The relevant expressions describing the transition from the one to the other are derived and illustrated