Portal de Periódicos da CAPES

Monte Carlo Simulation of Single Event Effects

2010; Institute of Electrical and Electronics Engineers; Volume: 57; Issue: 4 Linguagem: Inglês

10.1109/tns.2010.2044807

1558-1578

Robert A. Weller, Marcus H. Mendenhall, Robert A. Reed, Ronald D. Schrimpf, Kevin M. Warren, Brian D. Sierawski, L. W. Massengill,

Advanced Battery Technologies Research

In this paper, we describe a Monte Carlo approach for estimating the frequency and character of single event effects based on a combination of physical modeling of discrete radiation events, device simulations to estimate charge transport and collection, and circuit simulations to determine the effect of the collected charge. A mathematical analysis of the procedure reveals it to be closely related to the rectangular parallelepiped (RPP) rate prediction method. The results of these simulations show that event-to-event variation may have a significant impact when predicting the single-event rate in advanced spacecraft electronics. Specific criteria for supplementing established RPP-based single event analysis with Monte Carlo computations are discussed.