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Electron-microscope images of the crystal lattice of gold containing planar defects

1983; Wiley; Volume: 39; Issue: 4 Linguagem: Inglês

10.1107/s0108767383001002

1600-5724

Y. Takai, Hiroki Hashimoto, H. Endoh,

Force Microscopy Techniques and Applications

Using the aberration-free focus (AFF) imaging condition in tilted illumination and by adjusting the thickness of gold crystals to optimum values, the electron-microscope images of gold atoms in perfect crystals are formed at the correct positions of atoms with a resolution higher than the theoretical resolution limit in normal operation. This method is applied to observe the images of atoms in gold crystals containing planar defects such as twin boundaries and stacking faults. The observed contrast of the images is compared with theoretical calculations based on both the Howie-Whelan theory of electron diffraction in many-beam form and an electron image-formation theory. The agreement between observations and theoretical calculations is fairly good.