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An Introduction to Helium Ion Microscopy

2006; Oxford University Press; Volume: 12; Issue: S02 Linguagem: Inglês

10.1017/s1431927606069820

1435-8115

John Notte, R. Hill, Shawn McVey, L. Farkas, R.M. Percival, Bill Ward,

Electron and X-Ray Spectroscopy Techniques

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005