A Review of kWh/kWp Measurements, Analysis and Modelling
2008; Linguagem: Inglês
10.4229/23rdeupvsec2008-4do.9.6
Autores Tópico(s)Silicon and Solar Cell Technologies
ResumokWh/kWp energy yield comparisons have been measured and modelled around the world for many years using individual modules or large arrays [1]-[7]. Most studies just publish one value of kWh energy yield over a year. Often tests disagree with each other as to which technology (e.g. c-Si or a Thin Film) or which manufacturer gives the highest yields. In their conclusions authors often attribute variations in yield to be technology related due to differences in intrinsic properties e.g. relative performance at low light levels, high angle of incidence, high diffuse fraction or high temperatures. However without analysing and reporting the raw data there is no way to determine which of several factors are the most critical to determine the final energy yield. This paper analyses in detail a study performed by ISET on seven different technologies to determine how to tell which factors were the most important.
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