Heterotic Performance for Yield and Yield Traits in Durum (Triticum Durum Desf.) Wheat Crosses
2005; Volume: 32; Issue: 2 Linguagem: Inglês
ISSN
0256-0933
Autores Tópico(s)Wheat and Barley Genetics and Pathology
ResumoA set of 10 x 10 diallel crosses (excluding reciprocals) were analysed to assess the heterotic response over better parent and inbreeding depression for grain yield and its component traits. Maximum grain yield heterosis over better parent was 58.38% at Durgapura and 73.59% at Sriganganagar locations in Rajasthan environment. Magnitude of heterosis over better parent indicated that yield per plant was the most heterotic character. The crosses showing heterosis for yield per plant were not heterotic for all the traits. Crosses Cr's’/Gs's’//NP 401 LGM 184/Bittern's and LGM 184/NP 401 were more heterotic for yield per plant over the environments. The study reveals good scope for commercial exploitation of heterosis as well as isolation of pure lines among the progenises of heterotic F1 for improvement of yield levels in durum wheat.
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