An X-Ray Spectrometer for Pixel Analysis of Art Objects
1991; International Centre for Diffraction Data; Volume: 35; Issue: B Linguagem: Inglês
10.1154/s0376030800013215
ISSN2631-3626
AutoresMichael Mantler, Manfred Schreiner, Franz Weber, Richard Ebner, Franz Mairinger,
Tópico(s)X-ray Spectroscopy and Fluorescence Analysis
ResumoAbstract An x-ray spectrometer has been designed for pixel by pixel analysis along lines or across selected areas of paintings and other art-objects. Characteristic technical data are: 0.8mm 2 pixel size, 800mm (vert.) by 1000mm (horiz.) by 200mm (perpendicularly to object) motion distances, ±20μm precision in positioning the system, 2x3m maximum object size (mounted vertically); 2.8kW x-ray tube; Si(Li)detector. PC's are used for instrument control and new, complex data evaluation software.
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