Atomic-scale observations of franckeite surface morphology
2002; Mineralogical Society of America; Volume: 87; Issue: 10 Linguagem: Inglês
10.2138/am-2002-1001
ISSN1945-3027
AutoresRené B. Henriksen, Emil Makovicky, S. L. S. Stipp, Camilla Nissen, Carrick M. Eggleston,
Tópico(s)Chalcogenide Semiconductor Thin Films
ResumoFranckeite, approximately Pb4.6Ag0.2Sn2.5Fe0.8Sb2S12.6, consists of alternating pseudohexagonal (H) and pseudotetragonal (Q) layers. Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) of freshly cleaved franckeite, from San José, Bolivia, revealed the atomic structure of the pseudohexagonal component. On AFM images, the expected pattern with b = 3.2 Å was observed. STM revealed a √3 × √3 superstructure, with b' = 6.3 Å, interpreted to be caused by tunneling effects. The pseudotetragonal layer was not identified in any images.
Referência(s)