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A Double Silicon Drift Type Detector System for EDS with Ultrahigh Efficiency and Throughput for TEM

2014; Oxford University Press; Volume: 20; Issue: S3 Linguagem: Inglês

10.1017/s143192761400748x

1435-8115

S. Kawai, Ichiro Onishi, T. Ishikawa, K. Yagi, T Iwama, Koji Miyatake, Y. Iwasawa, M. Matsushita, T. Kaneyama, Yukihito Kondo,

Non-Destructive Testing Techniques

Journal Article A Double Silicon Drift Type Detector System for EDS with Ultrahigh Efficiency and Throughput for TEM Get access S Kawai, S Kawai JEOL Ltd., 1-2 Musashino 3-chome, Akishima, Tokyo 196-8558, Japan Search for other works by this author on: Oxford Academic Google Scholar I Onishi, I Onishi JEOL Ltd., 1-2 Musashino 3-chome, Akishima, Tokyo 196-8558, Japan Search for other works by this author on: Oxford Academic Google Scholar T Ishikawa, T Ishikawa JEOL Ltd., 1-2 Musashino 3-chome, Akishima, Tokyo 196-8558, Japan Search for other works by this author on: Oxford Academic Google Scholar K Yagi, K Yagi JEOL Ltd., 1-2 Musashino 3-chome, Akishima, Tokyo 196-8558, Japan Search for other works by this author on: Oxford Academic Google Scholar T Iwama, T Iwama JEOL Ltd., 1-2 Musashino 3-chome, Akishima, Tokyo 196-8558, Japan Search for other works by this author on: Oxford Academic Google Scholar K Miyatake, K Miyatake JEOL Ltd., 1-2 Musashino 3-chome, Akishima, Tokyo 196-8558, Japan Search for other works by this author on: Oxford Academic Google Scholar Y Iwasawa, Y Iwasawa JEOL Ltd., 1-2 Musashino 3-chome, Akishima, Tokyo 196-8558, Japan Search for other works by this author on: Oxford Academic Google Scholar M Matsushita, M Matsushita JEOL Ltd., 1-2 Musashino 3-chome, Akishima, Tokyo 196-8558, Japan Search for other works by this author on: Oxford Academic Google Scholar T Kaneyama, T Kaneyama JEOL Ltd., 1-2 Musashino 3-chome, Akishima, Tokyo 196-8558, Japan Search for other works by this author on: Oxford Academic Google Scholar Y Kondo Y Kondo JEOL Ltd., 1-2 Musashino 3-chome, Akishima, Tokyo 196-8558, Japan Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 20, Issue S3, 1 August 2014, Pages 1150–1151, https://doi.org/10.1017/S143192761400748X Published: 27 August 2014