[Paper] A Low Noise and High Sensitivity Image Sensor with Imaging and Phase-Difference Detection AF in All Pixels
2016; Volume: 4; Issue: 2 Linguagem: Inglês
10.3169/mta.4.123
ISSN2186-7364
AutoresMasahiro Kobayashi, Michiko Johnson, Yoichi Wada, Tsuboi Hiromasa, Hideaki Takada, Togo Kenji, Takafumi Kishi, Hidekazu Takahashi, Takeshi Ichikawa, Shunsuke Inoue,
Tópico(s)Advanced Fluorescence Microscopy Techniques
ResumoIn this paper, we describe a device structure and optical design for a CMOS image sensor with phase-difference detection photodiodes (PD) for autofocus (AF) function. The individual pixel of this image sensor is composed of two horizontally displaced PDs separated by a PN junction. All the effective pixels function as both the imaging and the phase-difference detection AF (PDAF). We have realized a low dark random noise (1.8e- at 1PD, 2.5e- at 1pixel) and high sensitivity (78Ke-/lx.sec at 1green pixel) image sensor with the imaging and the PDAF functions in all the effective pixels.
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