Artigo Acesso aberto

[Paper] A Low Noise and High Sensitivity Image Sensor with Imaging and Phase-Difference Detection AF in All Pixels

2016; Volume: 4; Issue: 2 Linguagem: Inglês

10.3169/mta.4.123

ISSN

2186-7364

Autores

Masahiro Kobayashi, Michiko Johnson, Yoichi Wada, Tsuboi Hiromasa, Hideaki Takada, Togo Kenji, Takafumi Kishi, Hidekazu Takahashi, Takeshi Ichikawa, Shunsuke Inoue,

Tópico(s)

Advanced Fluorescence Microscopy Techniques

Resumo

In this paper, we describe a device structure and optical design for a CMOS image sensor with phase-difference detection photodiodes (PD) for autofocus (AF) function. The individual pixel of this image sensor is composed of two horizontally displaced PDs separated by a PN junction. All the effective pixels function as both the imaging and the phase-difference detection AF (PDAF). We have realized a low dark random noise (1.8e- at 1PD, 2.5e- at 1pixel) and high sensitivity (78Ke-/lx.sec at 1green pixel) image sensor with the imaging and the PDAF functions in all the effective pixels.

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