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Electronic structure of La Ni O 3 − x : An in situ soft x-ray photoemission and absorption study

2007; American Physical Society; Volume: 76; Issue: 15 Linguagem: Inglês

10.1103/physrevb.76.155104

1550-235X

Koji Horiba, Ritsuko Eguchi, M. Taguchi, A. Chainani, Akiko Kikkawa, Yasunori Senba, Haruhiko Ohashi, Shik Shin,

Electronic and Structural Properties of Oxides

We investigate the electronic structure of high-quality single-crystal LaNiO$_3$ (LNO) thin films using in situ photoemission spectroscopy (PES). The in situ high-resolution soft x-ray PES measurements on epitaxial thin films reveal the intrinsic electronic structure of LNO. We find a new sharp feature in the PES spectra crossing the Fermi level, which is derived from the correlated Ni 3$d$ $e_g$ electrons. This feature shows significant enhancement of spectral weight with decreasing temperature. From a detailed analysis of resistivity data, the enhancement of spectral weight is attributed to increasing electron correlations due to antiferromagnetic fluctuations.