Electron Emission from Robust CNTs Grown by Resist-AssistedPatterning
2008; Springer Science+Business Media; Volume: 53; Issue: 9(5) Linguagem: Inglês
10.3938/jkps.53.2735
ISSN1976-8524
AutoresChang‐Seok Lee, Jehwang Ryu, Haneol Lim, Kyung-Woo Min, IlOk Jeong, S. Manivannan, Jin Jang, Kyu-Chang Park, Ki-Seo Kim,
Tópico(s)Advancements in Semiconductor Devices and Circuit Design
Referência(s)