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NEXAFS SPECTROSCOPY AND MICROSCOPY OF NATURAL AND SYNTHETIC POLYMERS

2002; Linguagem: Inglês

10.1142/9789812775757_0006

1793-0766

Harald Ade, Stephen G. Urquhart,

Energetic Materials and Combustion

Advanced Series in Physical ChemistryChemical Applications of Synchrotron Radiation, pp. 285-355 (2002) No AccessNEXAFS SPECTROSCOPY AND MICROSCOPY OF NATURAL AND SYNTHETIC POLYMERSHarald Ade and Stephen UrquhartHarald AdeDepartment of Physics, North Carolina State University, Raleigh, NC27695, USA and Stephen UrquhartDepartment of Chemistry, University of Saskatchewan, 110 Science Place, Saskatoon, SK S7N 5C9, Canadahttps://doi.org/10.1142/9789812775757_0006Cited by:36 PreviousNext AboutSectionsPDF/EPUB ToolsAdd to favoritesDownload CitationsTrack CitationsRecommend to Library ShareShare onFacebookTwitterLinked InRedditEmail Abstract: The following sections are included: Introduction NEXAFS Spectroscopy Instrument Aspects of NEXAFS and Electron Energy Loss Spectroscopy NEXAFS Spectroscopy of Polymers: Chemical Sensitivity Chemical Sensitivity: Examples NEXAFS Spectroscopy of Polymers: Orientational Sensitivity NEXAFS Spectroscopy of Polymers: Quantitative Analysis Blends of Polycarbonate and Poly(butylene terephthalate) Quantitative Analysis of the Chemical Composition of Polyurethanes NEXAFS Microscopy: Instrumentation and Analysis Tools Quantitative Image Analysis NEXAFS Microscopy: Applications Surfaces and Thin Films Polyimide Films and Surface Overcoats and Lubricating Layers on Hard Disks Confined, Free Standing Homopolymer Thin Films Thin Film Blends Thin Film Polymer Bilayers Block Copolymer Thin Films Bulk Morphology and Composition of Multicomponent, Multiphasic Polymers NEXAFS Microscopy of Poly(ethylene terephthalate)/Vectra™ Blends Engineered Polyurethane Polymers Multilayers Elastomer Composites Fibers Organic Geochemistry Meteoritics and Interplanetary Dust Particles Soils and Environmental Studies Other Applications Summary and Future Outlook Acknowledgments References Keywords: NEXAFSpolymersmicro structuremicroscopyspectroscopy FiguresReferencesRelatedDetailsCited By 36A NIST facility for resonant soft x-ray scattering measuring nano-scale soft matter structure at NSLS-IIEliot Gann, Thomas Crofts, Glenn Holland, Peter Beaucage and Terry McAfee et al.10 March 2021 | Journal of Physics: Condensed Matter, Vol. 33, No. 16Evaluating Biogenicity on the Geological Record With Synchrotron-Based TechniquesFlavia Callefo, Lara Maldanis, Verônica C. 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Kiskinova22 August 2002 Chemical Applications of Synchrotron RadiationMetrics History KeywordsNEXAFSpolymersmicro structuremicroscopyspectroscopyPDF download