Silicon Dioxide (SiO2) (Glass)
1997; Elsevier BV; Linguagem: Inglês
10.1016/b978-012544415-6.50038-8
Autores Tópico(s)Laser Material Processing Techniques
ResumoPublisher Summary The room-temperature optical properties of silicon dioxide (SiO2) glass is extensively analyzed to obtain a self-consistent set of optical constants, refractive index n and extinction coefficient k , for this material, especially in the regions of strong absorption in the infrared and vacuum ultraviolet. However, when the absorption is high, these optical constants are usually obtained by Kramers- Kronig (KK) analysis of reflectance data that are difficult to measure with high accuracy. The KK analysis requires extrapolations into spectral regions for which no data exist, thereby introducing additional uncertainties in the derived n and k values. But in the region of low absorption, the index of refraction can be evaluated from prism data, and this is accomplished with great precision for SiO2. It is also noted for SiO2, the presence of water or OH absorption in the samples makes the determination of the intrinsic k values extremely difficult in certain parts of the infrared and vacuum ultraviolet spectral regions.
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