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X-Ray Diffraction Quantitative Analysis Using Intensity Ratios and External Standards

1981; International Centre for Diffraction Data; Volume: 25; Linguagem: Inglês

10.1154/s0376030800009915

2631-3626

Raymond P. Goehner,

Chemical Synthesis and Characterization

The use of quantitative x-ray diffraction (XRD) as an analytical technique has recently become increasingly popular. There ate primarily two reasons for this increasing interest in a relatively old discipline. The first is simply the need for quantitative phase analysis. This need arises from several sources such as government regulations on respiratory quartz, industrial quality control, and material research. X-ray diffraction provides a readily available technique for bulk phase analysis on chemically similiar phases. For phases which are elementally distinct, our sister science, x-ray fluorescence, can more easily provide the quantitation needed. The second reason for the increasing interest in quantitative XRD is the ready availability of automated powder diffractometers. These instruments remove much of the tedium involved in the collection and reduction of the data.