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Reverse Engineering Cadmium Yellow Paint from Munch’s “The Scream” with Correlative 3-D Spectroscopic and 4-D Crystallographic STEM

2016; Oxford University Press; Volume: 22; Issue: S3 Linguagem: Inglês

10.1017/s1431927616002142

1435-8115

Barnaby D.A. Levin, Kayla X. Nguyen, Megan E. Holtz, Marcie B. Wiggins, Malcolm G. Thomas, Eva Storevik Tveit, Jennifer L. Mass, R. L. Opila, Thomas P. Beebe, David A. Muller,

Building materials and conservation

Journal Article Reverse Engineering Cadmium Yellow Paint from Munch’s “The Scream” with Correlative 3-D Spectroscopic and 4-D Crystallographic STEM Get access Barnaby DA Levin, Barnaby DA Levin School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Search for other works by this author on: Oxford Academic Google Scholar Kayla X Nguyen, Kayla X Nguyen School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Search for other works by this author on: Oxford Academic Google Scholar Megan E Holtz, Megan E Holtz School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Search for other works by this author on: Oxford Academic Google Scholar Marcie B Wiggins, Marcie B Wiggins Department of Chemistry and Biochemistry & UD Surface Analysis Facility, University of Delaware, Newark, DE, USA Search for other works by this author on: Oxford Academic Google Scholar Malcolm G Thomas, Malcolm G Thomas Cornell Center for Materials Research, Cornell University, Ithaca, NY, USA Search for other works by this author on: Oxford Academic Google Scholar Eva S Tveit, Eva S Tveit The Munch Museum, Toyen, Oslo, Norway Search for other works by this author on: Oxford Academic Google Scholar Jennifer L Mass, Jennifer L Mass Department of Conservation, Rijksmuseum, Amsterdam, NL Search for other works by this author on: Oxford Academic Google Scholar Robert Opila, Robert Opila Department of Materials Science and Engineering, University of Delaware, Newark, DE, USA Search for other works by this author on: Oxford Academic Google Scholar Thomas Beebe, Thomas Beebe Department of Chemistry and Biochemistry & UD Surface Analysis Facility, University of Delaware, Newark, DE, USA Search for other works by this author on: Oxford Academic Google Scholar David A Muller David A Muller School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USAKavli Institute for Nanoscale Science, Cornell University, Ithaca, NY, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 258–259, https://doi.org/10.1017/S1431927616002142 Published: 25 July 2016