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Atomic Level Element Specific Investigation of Bimetallic Structures by Z-Contrast Imaging

2015; Oxford University Press; Volume: 21; Issue: S3 Linguagem: Inglês

10.1017/s1431927615004006

1435-8115

M. Cem Akatay, Sergio Sánchez, Steven A. Bradley,

Integrated Circuits and Semiconductor Failure Analysis

Journal Article Atomic Level Element Specific Investigation of Bimetallic Structures by Z-Contrast Imaging Get access M Cem Akatay, M Cem Akatay UOP LLC, A Honeywell Company Search for other works by this author on: Oxford Academic Google Scholar Sergio I Sanchez, Sergio I Sanchez UOP LLC, A Honeywell Company Search for other works by this author on: Oxford Academic Google Scholar Steven A Bradley Steven A Bradley UOP LLC, A Honeywell Company Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pages 641–642, https://doi.org/10.1017/S1431927615004006 Published: 23 September 2015