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Analysis of an Asynchronously Generated Race Condition

2016; Volume: 81368; Linguagem: Inglês

10.31399/asm.cp.istfa2016p0076

0890-1740

Clifford Howard, Kris Dickson, Kent Erington,

Radiation Effects in Electronics

Abstract An asynchronous Low Voltage Detect (LVD) interrupt during the self-test portion of the reset sequence of a microcontroller randomly caused a corrupted clock state that was not recoverable except through a power on reset, or POR. This paper discusses the techniques used to overcome the many obstacles encountered to determine the root cause of the race condition that corrupted the clock state machine registers.