Nonlinear microscopy using cylindrical vector beams: Applications to three-dimensional imaging of nanostructures
2017; Optica Publishing Group; Volume: 25; Issue: 11 Linguagem: Inglês
10.1364/oe.25.012463
ISSN1094-4087
AutoresGodofredo Bautista, Joona‐Pekko Kakko, Veer Dhaka, Xiaorun Zang, Lasse Karvonen, Hua Jiang, Esko I. Kauppinen, Harri Lipsanen, Martti Kauranen,
Tópico(s)Advanced Fluorescence Microscopy Techniques
ResumoThe three-dimensional (3D) optical fields that arise from the focusing of cylindrical vector beams (CVB) with radial and azimuthal polarizations provide new sources of contrast for optical microscopy of nano-objects. So far, these demonstrations have been restricted to two-dimensional transversal scanning, i.e., along the focal plane of interest, or use of point-like objects, i.e., single molecules and nanoparticles. Here, we demonstrate the first application of CVBs for 3D imaging of 3D nano-objects. This technique is done by acquiring 3D image scans of the second-harmonic generation signal from vertically-aligned semiconductor nanowires, whose second-order response is primarily driven by the longitudinal electric field, i.e., the field component along the nanowire axis. Our technique provides a new way to study individual nano-objects in three dimensions through the unique combination of nonlinear microscopy and CVBs.
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