Artigo
Flux threshold of He-ion-beam induced nano-fuzz growth on hot tungsten below and above the displacement damage threshold energy
2014; Cambridge University Press; Volume: 2014; Linguagem: Inglês
ISSN
0003-0503
AutoresHussein Hijazi, M. E. Bannister, Chad M. Parish, Harry M. Meyer, F. W. Meyer,
Tópico(s)Integrated Circuits and Semiconductor Failure Analysis
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