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From Atoms To Functional Nanomaterials; Structural Modifications As Observed Using Aberration-Corrected STEM

2017; Oxford University Press; Volume: 23; Issue: S1 Linguagem: Inglês

10.1017/s1431927617009977

1435-8115

Sergio Sánchez, Lawrence F. Allard, Melanie T. Schaal, Steven A. Bradley, G.J. Gajda,

Advanced Materials Characterization Techniques

Journal Article From Atoms To Functional Nanomaterials; Structural Modifications As Observed Using Aberration-Corrected STEM Get access Sergio I Sanchez, Sergio I Sanchez UOP LLC, a Honeywell Company, Des Plaines IL, USA Search for other works by this author on: Oxford Academic Google Scholar Lawrence F Allard, Lawrence F Allard Oak Ridge National Laboratory, Oak Ridge TN, USA Search for other works by this author on: Oxford Academic Google Scholar Melanie T Schaal, Melanie T Schaal UOP LLC, a Honeywell Company, Des Plaines IL, USA Search for other works by this author on: Oxford Academic Google Scholar Steven A Bradley, Steven A Bradley UOP LLC, a Honeywell Company, Des Plaines IL, USA Search for other works by this author on: Oxford Academic Google Scholar Gregory J Gajda Gregory J Gajda UOP LLC, a Honeywell Company, Des Plaines IL, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 23, Issue S1, 1 July 2017, Pages 1862–1863, https://doi.org/10.1017/S1431927617009977 Published: 04 August 2017