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Characterization of Brazilian ammunitions and their respective gunshot residues with ion beam techniques

2017; Elsevier BV; Volume: 7; Linguagem: Inglês

10.1016/j.forc.2017.09.001

2468-1709

A. Duarte, L.M. Silva, Cláudia Telles de Souza, E.M. Stori, Liana Appel Boufleur Niekraszewicz, L. Amaral, Johnny Ferraz Dias,

Ion-surface interactions and analysis

In this work we explore the potentialities of analytical techniques based on swift ion beams for the analysis of ammunitions and the respective gunshot residues (GSR). To that end, PIXE (Particle-Induced X-ray Emission), RBS (Rutherford Backscattering Spectrometry) and micro-PIXE were employed in order to provide elemental characterization of three different ammunitions, namely CHOG, EXPO +P+ and Clean Range (CR). Pristine cartridges were taken apart for the characterization of bullets, cases, primer and propellant. Subsequently, shooting sessions were carried out and relatively large GSRs (of the order of 50–150 μm across) ejected in the forward direction were collected and analyzed. The PIXE experiments were carried out employing 2.0 MeV protons with a beam spot size of 1 mm2. For the micro-PIXE experiments, the samples were irradiated with 2.2 MeV proton beams of 2 × 2 μm2. Finally, 1.2 MeV alpha particles were used for the RBS experiments. Quantitative analyzes were obtained for all constituents of the cartridges. The results show that elements like Pb, Ba and Sb are present in the primer of CHOG and EXPO +P+ ammunitions. Traces of Ba and Pb were found in the CR primers as well, while Sb is absent from these primers. The morphology of the GSRs reveals a spherical-like shape for GSRs from EXPO +P+ and Clean Range ammunitions. On the other hand, particles with an uneven shape were detected for the CHOG ammunition.