Produção Nacional
Revisado por pares
TID Effects on a Data Acquisition System With Design Diversity Redundancy
2017; Institute of Electrical and Electronics Engineers; Volume: 65; Issue: 1 Linguagem: Inglês
10.1109/tns.2017.2782689
ISSN1558-1578
AutoresCarlos J. González, Rafael G. Vaz, Matheus Berger Oliveira, Vicente W. Leorato, Odair Lélis Gonçalez, Tiago R. Balen,
Tópico(s)Low-power high-performance VLSI design
ResumoThis paper describes the results of a total ionizing dose test on a data acquisition system (DAS) protected with a design diversity redundancy technique. The DAS is composed of three analog-to-digital converters (ADCs) and two voters, implementing different levels of diversity (architectural and temporal). This system is implemented on a 130-nm commercial mixed-signal (MS) programmable system-on-chip (PSoC 5) from Cypress Semiconductor. The system was tested under 60 Co gamma radiation with a dose rate of 1 krad(Si)/h reaching a total dose of 242 krad(Si). One of the system copies presented a significant degradation on its linearity during the irradiation, while the others kept the functionality with less severe degradation, evidencing the advantage of using diversity to improve resilience in MS redundant systems. Additionally, dynamic parameters of the ADCs are evaluated, and failure mechanisms are discussed.
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