Automotive Functional Safety Assurance by POST with Sequential Observation

2018; Institute of Electrical and Electronics Engineers; Volume: 35; Issue: 3 Linguagem: Inglês

10.1109/mdat.2018.2799801

ISSN

2168-2364

Autores

Senling Wang, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Jun Matsushima,

Tópico(s)

Physical Unclonable Functions (PUFs) and Hardware Security

Resumo

Power-on self-test is an efficient means for covering safety-critical faults in automotive systems. This paper presents a multicycle logic BIST technique that avoids fault masking after multiple cycles by sequential observation using a new scan cell structure. -Hans-Joachim Wunderlich, Universität Stuttgart

Referência(s)
Altmetric
PlumX