Introduction to the Special Section on the 2017 RFIC Symposium
2018; Institute of Electrical and Electronics Engineers; Volume: 53; Issue: 5 Linguagem: Inglês
10.1109/jssc.2018.2821819
ISSN1558-173X
Autores Tópico(s)RFID technology advancements
ResumoThis Issue of the IEEE Journal of Solid-State Circuits features a special section with expanded versions of key invited papers presented at the 2017 Radio Frequency Integrated Circuits Symposium (RFIC Symposium), held in the Hawaii Convention Center, Honolulu, HI, USA, on June 4, 2017–June 6, 2017.
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