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Orientation Imaging Microscopy: Sample Preparation for Heavily Drawn Copper wires

2003; Oxford University Press; Volume: 9; Issue: S02 Linguagem: Inglês

10.1017/s1431927603441007

1435-8115

Daudi Waryoba, Peter Kalu,

Advanced X-ray Imaging Techniques

Journal Article Orientation Imaging Microscopy: Sample Preparation for Heavily Drawn Copper wires Get access D R Waryoba, D R Waryoba FAMU-FSU College of Engineering, and National High Magnetic Field Laboratory, Tallahassee, FL 32310 Search for other works by this author on: Oxford Academic Google Scholar P N Kalu P N Kalu FAMU-FSU College of Engineering, and National High Magnetic Field Laboratory, Tallahassee, FL 32310 Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 9, Issue S02, 1 August 2003, Pages 84–85, https://doi.org/10.1017/S1431927603441007 Published: 28 July 2003