Effect of Relative Surface Charge of Colloidal Silica and Sapphire on Removal Rate in Chemical Mechanical Polishing

2019; Springer Science+Business Media; Volume: 6; Issue: 2 Linguagem: Inglês

10.1007/s40684-019-00020-9

ISSN

2198-0810

Autores

Chuljin Park, Hyoungjae Kim, Hanchul Cho, Taekyung Lee, Doyeon Kim, Sangjik Lee, Haedo Jeong,

Tópico(s)

Laser Material Processing Techniques

Referência(s)