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Enhanced Radiation Resistance of Pure-Silica-Core Polarization-Maintaining PANDA Optical Fibers

2019; Institute of Electrical and Electronics Engineers; Volume: 31; Issue: 17 Linguagem: Inglês

10.1109/lpt.2019.2929656

1941-0174

А.Л. Томашук, Pavel F. Kashaykin, I. S. Azanova, Yulia O. Sharonova, Е. А. Поспелова, Olga L. Vokhmyanina, Tatiana V. Dimakova, Igor A. Maltsev, Ekaterina A. Bychkova, Sofia V. Galanova, S. L. Glushkov,

Glass properties and applications

Radiation-induced absorption (RIA) is investigated at λ = 1.55 μm in technologically improved pure-silica-core (PSC) PANDAs, in which we minimized drawing-induced silica network strain. The results of the steady-state γ- and pulsed-X-ray irradiations are compared with those obtained earlier on former, non-optimized PSC PANDAs. It is found that the technological improvements have resulted in nearly complete suppression of the most deleterious RIA band at ~1 eV to drastically improve the radiation resistance of the PSC PANDAs.