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Structural and optical characterization of dilute phosphide planar heterostructures with high nitrogen content on silicon

2019; Royal Society of Chemistry; Volume: 22; Issue: 2 Linguagem: Inglês

10.1039/c9ce01498e

1466-8033

Olga Yu. Koval, Vladimir V. Fedorov, N. V. Kryzhanovskaya, G A Sapunov, Д. А. Кириленко, E. V. Pirogov, Nikolay G. Filosofov, A. Yu. Serov, I. V. Shtrom, Alexey D. Bolshakov, Ivan S. Mukhin,

Nanowire Synthesis and Applications

Despite poor crystallinity, a dilute nitride phosphide heterostructure with 5% nitrogen content demonstrates PL response at RT centered at 1.76 eV.